NMOS logic circuits using 4H-SiC MOSFETs for high temperature applications - Le-Huu, M.; Schrey, F.; Grieb, M.; Schmitt, H.; Haeublein, Volker; Bauer, Anton; Ryssel, Heiner; Frey, Lothar (Trans Tech Publications Ltd, 2010)
Keywords: High temperature electronics; Logic gates; Mos reliability; Nmos; Tddb