A 31-dBm, high ruggedness power amplifier in 65-nm standard CMOS with high-efficiency stacked-cascode stages - Leuschner, Stephan; Pinarello, Sandro; Hodel, Uwe; Müller, Jan-Erik; Klar, Heinrich (Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE, 2010)