Nano-slit probes for near-field optical microscopy fabricated by focused ion beams - Danzebrink, H.; Dziomba, T.; Sulzbach, T.; Ohlsson, O.; Lehrer, C.; Frey, Lothar (Journal of Microscopy, 1999)
Keywords: Atomic force microscopy; Focused ion beam technique; Infrared microscopy; Nano-slit near-field probes; Scanning near-field optical microscopy