Intrinsic MOSFET leakage of high-k peripheral DRAM devices: Measurement and simulation - Roll, Guntrade; Jakschik, Stefan; Goldmann, M.; Wachowiak, A.; Mikolajick, Thomas; Frey, Lothar (2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012, 2012)